Mount
Through Hole
Number of Pins
3
EU RoHS
Compliant
ECCN (US)
EAR99
HTS
8541.29.00.95
Automotive
Unknown
PPAP
Unknown
Category
Power MOSFET
Channel Mode
Enhancement
Number of Elements per Chip
1
Maximum Drain Source Voltage (V)
500
Maximum Gate Source Voltage (V)
±30
Maximum Gate Threshold Voltage (V)
5
Maximum Continuous Drain Current (A)
16.5
Maximum Gate Source Leakage Current (nA)
100
Maximum IDSS (uA)
1
Typical Gate Charge @ Vgs (nC)
34.9@10V
Typical Gate Charge @ 10V (nC)
34.9
Typical Input Capacitance @ Vds (pF)
1724@25V
Maximum Power Dissipation (mW)
215000
Typical Fall Time (ns)
41
Typical Rise Time (ns)
88.5
Typical Turn-Off Delay Time (ns)
96.5
Typical Turn-On Delay Time (ns)
46
Minimum Operating Temperature (°C)
-55
Maximum Operating Temperature (°C)
150
Mounting
Through Hole
Package Height
21.46(Max)
Package Width
5.31(Max)
Package Length
16.26(Max)
PCB changed
3
Tab
Tab
Standard Package Name
TO-247
Supplier Package
TO-247
Lead Shape
Through Hole
Number of Elements
1
RoHS
Compliant
Packaging
Semiconductor package is a carrier / shell used to contain and cover one or more semiconductor components or integrated circuits. The material of the shell can be metal, plastic, glass or ceramic.
Tube
Part Status
Parts can have many statuses as they progress through the configuration, analysis, review, and approval stages.
Unconfirmed
Max Operating Temperature
The Maximum Operating Temperature is the maximum body temperature at which the thermistor is designed to operate for extended periods of time with acceptable stability of its electrical characteristics.
150 °C
Min Operating Temperature
-55 °C
Pin Count
a count of all of the component leads (or pins)
3
Configuration
Single
Power Dissipation
the process by which an electronic or electrical device produces heat (energy loss or waste) as an undesirable derivative of its primary action.
215 W
Continuous Drain Current (ID)
16.5 A
Gate to Source Voltage (Vgs)
30 V
Channel Type
N
Radiation Hardening
Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation, especially for environments in outer space (especially beyond the low Earth orbit), around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear warfare.
No