BF244B_J35Z

Rochester Electronics BF244B_J35Z

Part No:

BF244B_J35Z

Datasheet:

-

Package:

-

AINNX NO:

24138390-BF244B_J35Z

Description:

Products specifications
  • Mount
    Through Hole
  • Number of Pins
    3
  • Weight
    200.998119 mg
  • Voltage, Rating
    30 V
  • RoHS
    Compliant
  • Packaging

    Semiconductor package is a carrier / shell used to contain and cover one or more semiconductor components or integrated circuits. The material of the shell can be metal, plastic, glass or ceramic.

    Bulk
  • Max Operating Temperature

    The Maximum Operating Temperature is the maximum body temperature at which the thermistor is designed to operate for extended periods of time with acceptable stability of its electrical characteristics.

    150 °C
  • Min Operating Temperature
    -55 °C
  • Max Power Dissipation

    The maximum power that the MOSFET can dissipate continuously under the specified thermal conditions.

    350 mW
  • Current Rating

    Current rating is the maximum current that a fuse will carry for an indefinite period without too much deterioration of the fuse element.

    50 mA
  • Frequency
    100 MHz
  • Element Configuration

    The distribution of electrons of an atom or molecule (or other physical structure) in atomic or molecular orbitals.

    Single
  • Drain to Source Voltage (Vdss)
    30 V
  • Continuous Drain Current (ID)
    50 mA
  • Gate to Source Voltage (Vgs)
    -30 V
  • Noise Figure

    Noise figure (NF) and noise factor (F) are measures of degradation of the signal-to-noise ratio (SNR), caused by components in a signal chain.

    1.5 dB
  • Test Voltage
    15 V
  • Width
    4.19 mm
  • Height
    5.33 mm
  • Length
    5.2 mm
  • Radiation Hardening

    Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation, especially for environments in outer space (especially beyond the low Earth orbit), around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear warfare.

    No
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