APTC60DSKM70CT1G

Microchip APTC60DSKM70CT1G

Part No:

APTC60DSKM70CT1G

Manufacturer:

Microchip

Datasheet:

-

Package:

-

AINNX NO:

43272559-APTC60DSKM70CT1G

Description:

Trans MOSFET N-CH 600V 39A 10-Pin Case SP-1

Products specifications
  • Mount
    Chassis Mount, Screw
  • Number of Pins
    1
  • Number of Elements
    2
  • RoHS
    Compliant
  • Turn Off Delay Time

    It is the time from when Vgs drops below 90% of the gate drive voltage to when the drain current drops below 90% of the load current. It is the delay before current starts to transition in the load, and depends on Rg. Ciss.

    283 ns
  • Packaging

    Semiconductor package is a carrier / shell used to contain and cover one or more semiconductor components or integrated circuits. The material of the shell can be metal, plastic, glass or ceramic.

    Bulk
  • Max Operating Temperature

    The Maximum Operating Temperature is the maximum body temperature at which the thermistor is designed to operate for extended periods of time with acceptable stability of its electrical characteristics.

    150 °C
  • Min Operating Temperature
    -40 °C
  • Max Power Dissipation

    The maximum power that the MOSFET can dissipate continuously under the specified thermal conditions.

    250 W
  • Power Dissipation

    the process by which an electronic or electrical device produces heat (energy loss or waste) as an undesirable derivative of its primary action.

    250 W
  • Turn On Delay Time

    Turn-on delay, td(on), is the time taken to charge the input capacitance of the device before drain current conduction can start.

    21 ns
  • Rise Time

    In electronics, when describing a voltage or current step function, rise time is the time taken by a signal to change from a specified low value to a specified high value.

    30 ns
  • Drain to Source Voltage (Vdss)
    600 V
  • Continuous Drain Current (ID)
    39 A
  • Gate to Source Voltage (Vgs)
    20 V
  • Input Capacitance

    The capacitance between the input terminals of an op amp with either input grounded. It is expressed in units of farads.

    7 nF
  • Rds On Max
    70 mΩ
  • Radiation Hardening

    Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation, especially for environments in outer space (especially beyond the low Earth orbit), around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear warfare.

    No
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