6013AGP10MOT2

Wcon 6013AGP10MOT2

Part No:

6013AGP10MOT2

Manufacturer:

Wcon

Datasheet:

-

Package:

-

AINNX NO:

45579201-6013AGP10MOT2

Category:

Miscellaneous

Description:

BW Controls Miscellaneous

Products specifications
  • Lifecycle Status
    Production (Last Updated: 1 week ago)
  • Contact Plating

    Contact plating (finish) provides corrosion protection for base metals and optimizes the mechanical and electrical properties of the contact interfaces.

    Tin
  • Mount
    Axial, Through Hole
  • Voltage, Rating
    350 V
  • RoHS
    Compliant
  • Manufacturer Part Number
    6013AGP10MOT2
  • Manufacturer
    BW Controls
  • Packaging

    Semiconductor package is a carrier / shell used to contain and cover one or more semiconductor components or integrated circuits. The material of the shell can be metal, plastic, glass or ceramic.

    Bulk
  • Tolerance
    0.1 %
  • Number of Terminations
    2
  • Temperature Coefficient

    The resistance-change factor per degree Celsius of temperature change is called the temperature coefficient of resistance. This factor is represented by the Greek lower-case letter “alpha” (α). A positive coefficient for a material means that its resistance increases with an increase in temperature.

    25 ppm/°C
  • Resistance
    249 kΩ
  • Max Operating Temperature

    The Maximum Operating Temperature is the maximum body temperature at which the thermistor is designed to operate for extended periods of time with acceptable stability of its electrical characteristics.

    155 °C
  • Min Operating Temperature
    -55 °C
  • Composition
    Metal Film, Thin Film
  • Power Rating
    250 mW
  • Max Power Dissipation

    The maximum power that the MOSFET can dissipate continuously under the specified thermal conditions.

    250 mW
  • ELV
    Compliant
  • Number of Resistors
    1
  • Length
    7.1882 mm
  • Diameter
    2.5 mm
  • Radiation Hardening

    Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation, especially for environments in outer space (especially beyond the low Earth orbit), around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear warfare.

    No
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