2-1622800-2

TE Connectivity 2-1622800-2

Part No:

2-1622800-2

Manufacturer:

TE Connectivity

Datasheet:

-

Package:

-

AINNX NO:

39648744-2-1622800-2

Description:

Res Thick Film NET 4.7K Ohm 5% ±200ppm/°C BUS Conformal 5-Pin SIP Pin Thru-Hole Loose Pack

Products specifications
  • Number of Pins
    5
  • Number of Terminals
    5
  • Lead Free Status / RoHS Status
    --
  • RoHS
    Compliant
  • Series
    *
  • Packaging

    Semiconductor package is a carrier / shell used to contain and cover one or more semiconductor components or integrated circuits. The material of the shell can be metal, plastic, glass or ceramic.

    Bulk
  • Tolerance
    5 %
  • Part Status

    Parts can have many statuses as they progress through the configuration, analysis, review, and approval stages.

    Active
  • Moisture Sensitivity Level (MSL)
    --
  • Termination
    Pin
  • Temperature Coefficient

    The resistance-change factor per degree Celsius of temperature change is called the temperature coefficient of resistance. This factor is represented by the Greek lower-case letter “alpha” (α). A positive coefficient for a material means that its resistance increases with an increase in temperature.

    200 ppm/°C
  • Resistance
    4.7 kΩ
  • Max Operating Temperature

    The Maximum Operating Temperature is the maximum body temperature at which the thermistor is designed to operate for extended periods of time with acceptable stability of its electrical characteristics.

    125 °C
  • Min Operating Temperature
    -55 °C
  • Terminal Pitch

    The center distance from one pole to the next.

    2.54 mm
  • Depth
    2.5 mm
  • Military Standard
    Not
  • Number of Resistors
    4
  • Length
    12.7 mm
  • Radiation Hardening

    Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation, especially for environments in outer space (especially beyond the low Earth orbit), around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear warfare.

    No
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