S9S08DZ48F2CLH

NXP Semiconductors S9S08DZ48F2CLH

Part No:

S9S08DZ48F2CLH

Manufacturer:

NXP Semiconductors

Package:

-

AINNX NO:

69823551-S9S08DZ48F2CLH

Description:

8-bit MCU, S08 core, 48KB Flash, 40MHz, -40/+85degC, Automotive Qualified, QFP 64

Products specifications
  • Mount
    Surface Mount
  • Number of Pins
    64
  • Weight
    346.544571 mg
  • Case/Package
    LQFP
  • Memory Types
    FLASH
  • Number of I/Os
    53
  • RoHS
    Compliant
  • Watchdog Timers
    Yes
  • Max Operating Temperature

    The Maximum Operating Temperature is the maximum body temperature at which the thermistor is designed to operate for extended periods of time with acceptable stability of its electrical characteristics.

    85 °C
  • Min Operating Temperature
    -40 °C
  • Frequency
    40 MHz
  • Interface
    CAN, I2C, LIN, SCI, SPI
  • Max Supply Voltage

    In general, the absolute maximum common-mode voltage is VEE-0.3V and VCC+0.3V, but for products without a protection element at the VCC side, voltages up to the absolute maximum rated supply voltage (i.e. VEE+36V) can be supplied, regardless of supply voltage.

    5.5 V
  • Min Supply Voltage

    The minimum supply voltage (V min ) is explored for sequential logic circuits by statistically simulating the impact of within-die process variations and gate-dielectric soft breakdown on data retention and hold time.

    2.7 V
  • Memory Size

    The memory capacity is the amount of data a device can store at any given time in its memory.

    48 kB
  • Oscillator Type

    Wien Bridge Oscillator; RC Phase Shift Oscillator; Hartley Oscillator; Voltage Controlled Oscillator; Colpitts Oscillator; Clapp Oscillators; Crystal Oscillators; Armstrong Oscillator.

    External
  • RAM Size
    3 kB
  • Peripherals
    LVD, POR, PWM, WDT
  • Data Bus Width
    8 b
  • Halogen Free
    Halogen Free
  • Number of Timers/Counters
    8
  • Core Architecture
    S08
  • Max Frequency
    40 MHz
  • Number of Programmable I/O
    54
  • Number of ADC Channels
    24
  • Radiation Hardening

    Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation, especially for environments in outer space (especially beyond the low Earth orbit), around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear warfare.

    No
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