A10V10B-PLG68C

Microchip A10V10B-PLG68C

Part No:

A10V10B-PLG68C

Manufacturer:

Microchip

Datasheet:

-

Package:

-

AINNX NO:

32737698-A10V10B-PLG68C

Description:

IC FPGA 1200 GATES 68-PLCC COM

Products specifications
  • Surface Mount

    having leads that are designed to be soldered on the side of a circuit board that the body of the component is mounted on.

    YES
  • Mount
    Surface Mount
  • Number of Terminals
    68
  • Manufacturer Part Number
    A10V10B-PLG68C
  • Rohs Code
    Yes
  • Part Life Cycle Code
    Obsolete
  • Ihs Manufacturer
    MICROSEMI CORP
  • Package Description
    QCCJ, LDCC68,1.0SQ
  • Risk Rank
    5.81
  • Clock Frequency-Max
    50 MHz
  • Moisture Sensitivity Levels
    3
  • Operating Temperature-Max
    70 °C
  • Package Body Material
    PLASTIC/EPOXY
  • Package Code
    QCCJ
  • Package Equivalence Code
    LDCC68,1.0SQ
  • Package Shape
    SQUARE
  • Package Style
    CHIP CARRIER
  • Supply Voltage-Max
    3.6 V
  • Supply Voltage-Nom
    3.3 V
  • Reflow Temperature-Max (s)
    40
  • Number of I/Os
    57
  • RoHS
    Compliant
  • Supply Voltage-Min
    3 V
  • JESD-609 Code
    e3
  • Terminal Finish
    MATTE TIN
  • Max Operating Temperature

    The Maximum Operating Temperature is the maximum body temperature at which the thermistor is designed to operate for extended periods of time with acceptable stability of its electrical characteristics.

    70 °C
  • Min Operating Temperature
    0 °C
  • Additional Feature

    Any Feature, including a modified Existing Feature, that is not an Existing Feature.

    MAX 57 I/OS
  • Terminal Position
    QUAD
  • Terminal Form

    Occurring at or forming the end of a series, succession, or the like; closing; concluding.

    J BEND
  • Peak Reflow Temperature (Cel)
    245
  • Terminal Pitch

    The center distance from one pole to the next.

    1.27 mm
  • Reach Compliance Code
    compliant
  • JESD-30 Code
    S-PQCC-J68
  • Number of Outputs
    57
  • Qualification Status

    An indicator of formal certification of qualifications.

    Not Qualified
  • Operating Supply Voltage

    The voltage level by which an electrical system is designated and to which certain operating characteristics of the system are related.

    3.3 V
  • Power Supplies

    an electronic circuit that converts the voltage of an alternating current (AC) into a direct current (DC) voltage.?

    3.3 V
  • Temperature Grade

    Temperature grades represent a tire's resistance to heat and its ability to dissipate heat when tested under controlled laboratory test conditions.

    COMMERCIAL
  • Propagation Delay

    the flight time of packets over the transmission link and is limited by the speed of light.

    6.5 ns
  • Number of Inputs
    57
  • Organization
    295 CLBS, 1200 GATES
  • Seated Height-Max
    4.445 mm
  • Programmable Logic Type

    Generally, programmable logic devices can be described as being one of three different types: Simple programmable logic devices (SPLD) Complex programmable logic devices (CPLD) Field programmable logic devices (FPGA).

    FIELD PROGRAMMABLE GATE ARRAY
  • Number of Gates

    The number of gates per IC varies depending on the number of inputs per gate. Two?input gates are common, but if only a single input is required, such as in the 744 NOT(or inverter) gates, a 14 pin IC can accommodate 6 (or Hex) gates.

    1200
  • Number of Logic Blocks (LABs)
    295
  • Number of Registers
    147
  • Combinatorial Delay of a CLB-Max
    4.5 ns
  • Number of CLBs
    295
  • Number of Logic Cells

    An FPGA contains a large number of logic cells. Each logic cell can be configured to implement a certain set of functions. Each logic cell has a fixed number of inputs and outputs. Flip-flop can be incorporated into a multiplexer-based logic module to implement sequential logic.

    295
  • Number of Equivalent Gates
    1200
  • Length
    24.13 mm
  • Width
    24.13 mm
  • Radiation Hardening

    Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation, especially for environments in outer space (especially beyond the low Earth orbit), around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear warfare.

    No
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