0371B

HEYCO PRODUCTS 0371B

Part No:

0371B

Manufacturer:

HEYCO PRODUCTS

Datasheet:

-

Package:

-

AINNX NO:

45195052-0371B

Category:

Rivets

Description:

HEYClip™ Nylon Push-In Fasteners - Assembled Panel Thickness Sequence

Products specifications
  • Mount
    Screw
  • Number of Pins
    2
  • Material
    Nylon
  • Number of Elements
    1
  • RoHS
    Compliant
  • Mounting Hole Dia
    0.218
  • Unit Weight
    0.740753 oz
  • Factory Pack QuantityFactory Pack Quantity
    15000
  • Manufacturer
    Heyco
  • Brand
    Heyco
  • Tradename
    HEYClip
  • Packaging

    Semiconductor package is a carrier / shell used to contain and cover one or more semiconductor components or integrated circuits. The material of the shell can be metal, plastic, glass or ceramic.

    Box
  • Series
    HEYClip Nylon Push-In Fasteners
  • Type
    Fastener
  • Color
    White
  • Subcategory
    Hardware
  • Depth
    88.2 mm
  • Style
    Slotted
  • Max Current Rating
    900 mA
  • Viewing Angle

    the angle at which a display can be viewed with acceptable visual performance.

    85 °
  • Forward Current

    Current which flows upon application of forward voltage.

    940 mA
  • Lens Style
    Flat, Round
  • Test Current
    900 mA
  • Forward Voltage

    the amount of voltage needed to get current to flow across a diode.

    39.7 V
  • Product Type

    a group of products which fulfill a similar need for a market segment or market as a whole.

    Screws & Fasteners
  • Illumination Color
    White
  • Luminous Flux

    the measure of the perceived power of light.

    4 klm
  • Number of LEDs
    1
  • Color Rendering Index (CRI)
    90
  • Product Category

    a particular group of related products.

    Screws & Fasteners
  • Test Temperature
    85 °C
  • Width
    30 mm
  • Height
    30 mm
  • Length
    88.2 mm
  • Diameter
    88.2 mm
  • REACH SVHC
    Unknown
  • Radiation Hardening

    Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation, especially for environments in outer space (especially beyond the low Earth orbit), around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear warfare.

    No
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