MC74HC00ADR2G

AMI Semiconductor MC74HC00ADR2G

Part No:

MC74HC00ADR2G

Manufacturer:

AMI Semiconductor

Datasheet:

-

Package:

2512 (6432 Metric)

AINNX NO:

40847351-MC74HC00ADR2G

Description:

Products specifications
  • Package / Case
    2512 (6432 Metric)
  • Mounting Type
    Surface Mount
  • Supplier Device Package
    2512
  • Package
    Tape & Reel (TR)
  • Base Product Number
    RNCF2512D
  • Mfr
    Stackpole Electronics Inc
  • Product Status
    Active
  • Lead Free Status / RoHS Status
    Lead free / RoHS Compliant
  • Other Names
    MC74HC00ADR2GOS MC74HC00ADR2GOS-ND MC74HC00ADR2GOSTR
  • Logic Level-High
    1.5 V ~ 4.2 V
  • Logic Level-Low
    0.5 V ~ 1.8 V
  • Operating Temperature

    The operating temperature is the range of ambient temperature within which a power supply, or any other electrical equipment, operate in. This ranges from a minimum operating temperature, to a peak or maximum operating temperature, outside which, the power supply may fail.

    -55°C ~ 155°C
  • Series
    RNCF
  • Packaging

    Semiconductor package is a carrier / shell used to contain and cover one or more semiconductor components or integrated circuits. The material of the shell can be metal, plastic, glass or ceramic.

    Tape & Reel (TR)
  • Size / Dimension
    0.248 L x 0.122 W (6.30mm x 3.10mm)
  • Tolerance
    ±0.5%
  • Moisture Sensitivity Level (MSL)
    1 (Unlimited)
  • Number of Terminations
    2
  • Temperature Coefficient

    The resistance-change factor per degree Celsius of temperature change is called the temperature coefficient of resistance. This factor is represented by the Greek lower-case letter “alpha” (α). A positive coefficient for a material means that its resistance increases with an increase in temperature.

    ±25ppm/°C
  • Resistance
    36 kOhms
  • Composition
    Thin Film
  • Power (Watts)
    0.5W, 1/2W
  • Voltage - Supply
    2 V ~ 6 V
  • Base Part Number
    74HC00
  • Failure Rate

    the frequency with which an engineered system or component fails, expressed in failures per unit of time. It is usually denoted by the Greek letter λ (lambda) and is often used in reliability engineering.

    -
  • Number of Circuits
    4
  • Number of Inputs
    2
  • Current - Output High, Low
    5.2mA, 5.2mA
  • Logic Type
    NAND Gate
  • Max Propagation Delay @ V, Max CL
    13ns @ 6V, 50pF
  • Current - Quiescent (Max)
    1µA
  • Features
    Automotive AEC-Q200
  • Height Seated (Max)
    0.026 (0.65mm)
  • Ratings
    AEC-Q200
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