05400782161

3M 05400782161

Part No:

05400782161

Manufacturer:

3M

Datasheet:

-

Package:

16-SOIC (0.154, 3.90mm Width)

AINNX NO:

46028885-05400782161

Description:

Cable Accessories Long Wire Test Clip Alloy 64 POS

Products specifications
  • Package / Case
    16-SOIC (0.154, 3.90mm Width)
  • Mounting Type
    Surface Mount
  • Number of Pins
    64
  • Supplier Device Package
    16-SOIC
  • Product Status
    Active
  • Channel-to-Channel Matching (ΔRon)
    300mOhm
  • Mfr
    Analog Devices Inc./Maxim Integrated
  • Base Product Number
    MAX314
  • Package
    Tube
  • RoHS
    Compliant
  • Series
    -
  • Operating Temperature

    The operating temperature is the range of ambient temperature within which a power supply, or any other electrical equipment, operate in. This ranges from a minimum operating temperature, to a peak or maximum operating temperature, outside which, the power supply may fail.

    -40°C ~ 85°C (TA)
  • Packaging

    Semiconductor package is a carrier / shell used to contain and cover one or more semiconductor components or integrated circuits. The material of the shell can be metal, plastic, glass or ceramic.

    Bulk
  • Number of Circuits
    4
  • -3db Bandwidth
    -
  • On-State Resistance (Max)
    10Ohm
  • Multiplexer/Demultiplexer Circuit
    1:1
  • Current - Leakage (IS(off)) (Max)
    500pA
  • Channel Capacitance (CS(off), CD(off))
    15pF, 15pF
  • Switch Circuit

    establishes connections between links, on demand and as available, in order to establish an end-to-end circuit between devices.

    SPST - NO/NC
  • Switch Time (Ton, Toff) (Max)
    225ns, 185ns
  • Charge Injection

    A Charge injection in analog switches and multiplexers is a level change caused by stray capacitance associated with the NMOS and PMOS transistors that make up the analog switch.

    20pC
  • Crosstalk
    -85dB @ 1MHz
  • Voltage - Supply, Single (V+)
    4.5V ~ 36V
  • Voltage - Supply, Dual (V±)
    ±4.5V ~ 20V
  • Radiation Hardening

    Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation, especially for environments in outer space (especially beyond the low Earth orbit), around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear warfare.

    No
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